Thu, Sep 09 | online

Cryogenic Electron Microscopy of Beam and Air-Sensitive Materials

e will present the workflow and logistics of using the Center for Integrated Nanotechnologies (CINTs) cryo-EM lab, in particular focused ion beam (FIB) lift out techniques and the unique challenges involved with performing this method at cryogenic temperatures.
Registration is Closed
Cryogenic Electron Microscopy of Beam and Air-Sensitive Materials

Time & Location

Sep 09, 11:00 AM CDT
online
Registration is Closed

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